我们对分形测度投影中的例外参数建立了几个最优估计：(1) 对于满足横截性条件的一族自相似测度，导致维数下降的参数集最多为可数集。(2) 对于$\mathbb{R}^2$上的任意遍历CP-分布$Q$，其正交投影的Hausdorff维数在除了至多可数个方向外均为$\min\{1, \dim Q\}$。我们的投影结果的应用包括：(i) 对于任何平面Borel概率测度，其均匀熵维数为$\alpha$，其正交投影的填充维数在除了至多可数个方向外至少为$\min\{1, \alpha\}$。(ii) 对于任何平面集合$F$，其正交投影的Assouad维数在除了至多可数个方向外至少为$\min\{1, \dim_{\rm A} F\}$。

We establish several optimal estimates for exceptional parameters in the projection of fractal measures: (1) For a parametric family of self-similar measures satisfying a transversality condition, the set of parameters leading to a dimension drop is at most countable. (2) For any ergodic CP-distribution $Q$ on $\mathbb{R}^2$, the Hausdorff dimension of its orthogonal projection is $\min\{1, \dim Q\}$ in all but at most countably many directions. Applications of our projection results include: (i) For any planar Borel probability measure with uniform entropy dimension $\alpha$, the packing dimension of its orthogonal projection is at least $\min\{1, \alpha\}$ in all but at most countably many directions. (ii) For any planar set $F$, the Assouad dimension of its orthogonal projection is at least $ \min\{1, \dim_{\rm A} F\} $ in all but at most countably many directions.